• Polaron E3000 critical point dryer
  • Polaron E5100 sputter coater
    • Carbon coating apparatus
    • Titling & etching stage
    • Film thickness monitor
    • Thermocouple meter
  • EMS 150T ES – A high resolution sputter coater and high vacuum carbon evaporator
    • Metal sputtering or carbon evaporation
    • Fine grain sputtering – for advanced high resolution FESEM applications.
    • High vacuum turbo pumping – allows sputtering of a wide range of oxidizing and non-oxidizing metals – suitable for SEM, high resolution FESEM and also for many thin film applications
    • High vacuum carbon coating – ideal for SEM and TEM carbon coating applications
    • Fully automatic touch screen control – rapid data input, simple operation
    • Thick film capabilities – up to 60 minutes sputtering time without breaking vacuum
    • Note: The EMS 150T ES sputter coater has a Platinum Target for fine grain sputtering.
    • Optional targets for future acquisition are: Gold, Iridium and Chromium.
    • Optional future acquisition: film thickness monitor for precise thickness control.
  • Reichert-Jung Ultracut E ultramicrotomes (2)
  • Fischion
    • Ion Mill
    • Dimpler Grinder
  • South Bay Technology
    • Diamond Wheel Saw
    • Rotary Die Cutter
    • Disc punch
    • Plasma cleaner
  • Epson 4990 Flatbed photo scanner
  • Light microscopes
  • Zeiss research microscope
  • MiniCL

    The MiniCL is a simple but effective cathodoluminescense (CL) imaging system, which is interfaced to the Zeiss EVO 50 Variable Pressure SEM. The novel design utilizes a miniature, highly sensitive photomultiplier tube (PMT), which is mounted inside the SEM chamber at the end of a retractable probe. The detector can be positioned close to the sample, whilst under vacuum, allowing efficient collection of CL emission whether at low or high magnification. A simple 'push on' mirror is provided, which facilitates improved collection of light emitted close to the sample without restricting low magnification imaging or back scatter detection. The probe can be easily retracted to allow the use of other detectors or large sample movements.

    The output from the MiniCL is connected to the SEM auxiliary input allowing the CL image to be displayed on the SEM monitor. A prime example for use of the detector is for studying zonation in minerals such as Zircon.