An atomic force microscope is a type of high resolution scanning probe microscope that
has a resolution that you can measure in fractions of a nanometer.
More detailed information on Atomic Force Microscopy can be found here: The Atomic Force Microscope (AFM), What are its Uses in Microscopy Today
The JEOL 6500F Field Emissions SEM
The HITACHI TM-1000 Table-Top SEM
The JEOL 1230 120kV TEM