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Confocal Laser Scanning Microscopy

Axiovert 200 M Inverted Research Microscope
  • 3 Confocal detection channels
  • Laser lines [nm]
    • 405 Diode 30 MW
    • Argon multiline (458/477/488/514 30 MW)
    • 543 HeNe 10 MW
    • 594 HeNe 2 MW
    • 633 HeNe 5 MW
  • Objectives: "Type" magnification/numerical aperture, Working Distance
    • "Plan Apochromat" 5x/0.16, WD=12.1
    • EC "Plan Neofluar" 10x/0.30, WD=5.60
    • "Plan-Apochromat" 20x/0.80, WD=0.55
    • EC Plan "Neofluar" 40x/1.30 Oil DIC, WD=0.20
    • "C-Apochromat" 40x/1.20 W corr, WD=0.28
    • "Plan-Apochromat" 63x/1.40 Oil DIC, WD=0.18
    • "Plan-Apochromat" 100x/1.40 Oil DIC, WD=0.17
  • Mercury light source for fluorescence viewing
A image taken using this microscope

Atomic Force Microscopes

An atomic force microscope is a type of high resolution scanning probe microscope that has a resolution that you can measure in fractions of a nanometer.

More detailed information on Atomic Force Microscopy can be found here: The Atomic Force Microscope (AFM), What are its Uses in Microscopy Today

Dimension Icon AFM with ScanAsyst
A picture of the Dimension Icon AFM
  • Resolution: ~nm range and possible ~Am
  • XY piezo: 90 micrometers
  • Z piezo: 10 micrometers
  • Capabilities:
    • PeakForce Tapping
    • Contact mode
    • Tapping mode
    • MFM (Magnetic force microscopy
  • Electricity:
    • CAFM (conductive AFM)
    • EFM (Electrostatic force microscopy)
    • KPFM (Kelvin Probe force microscopy)
    • PeakForce Tuna (PeakForce Tunnelling AFM)
    • EC-AFM (Electrochemical AFM)
    • IV curve
  • PeakForce QNM (PeakForce Quantitative Naomechanics):
    • Young’s modulus
    • Reduce modulus
    • Stiffness
    • Adhesion
    • Deformation
    • Dissipation
  • Nanolithography
  • Temperature range: -50 ~ 250 C
BioScope Catalyst AFM with ScanAsyst
The Bioscope Catalyst AFM
  • Resolution: ~nm range
  • XY piezo: 150 micrometers
  • Z piezo: 15-20 micrometers
  • Capabilities:
    • PeakForce Tapping
    • Contact mode
    • Tapping mode
    • MFM (Magnetic force microscopy
    • EFM (Electrostatic force microscopy)
  • PeakForce QNM (PeakForce Quantitative Nanomechanics):
    • Young’s modulus
    • Reduce modulus
    • Stiffness
    • Adhesion
    • Deformation
  • Temperature Range: ~40 C
  • The Microscope Image Registration and Overlay (MIRO™) feature automatically imports and rescales light microscope images, allowing them to be used to direct the location of AFM imaging and force measurements
Caliber AFM
A picture of the Caliber AFM
  • 3-axis high accuracy with closed-loop and sensored-Z piezo scanners
  • Compact easy to handle microscope head adaptable to most environments
  • Scanning tip design provides unlimited sample size capability
  • Extensive control & analysis software allows simultaneous scanning and analysis
  • Capability to easily expand for Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM) and Nanolithography capabilities

Scanning Electron Microscopes

JEOL 6500F Field Emission SEM
  • 'Video Classroom' equipped for two-way interactive communications with remote sites via the Internet
  • Backscattered and secondary electron detectors
  • Digital image storage
  • With attached X-EDS spectrometer and Oxford Instruments INCAEnergy+ software for electron beam-induced X-ray elemental analysis
    • with ultra-thin window (for boron and higher atomic number element detection)
  • With attached EBSD detector and Oxford Instruments INCA Crystal software for Electron Backscatter Diffraction (EBSD) crystallographic analysis
  • Maintained on service contract
  • Resolution on secondary electron image:
    • 1.5 nm (at accelerating voltage 15kV)
    • 5.0 nm (at accelerating voltage 1kV)
  • Accelerating voltage: 0.5 to 30 kV
  • Magnification range: 10X to 500,000X
A picture of the JEOL 6500F Field Emission SEM

The JEOL 6500F Field Emissions SEM

ZEISS EVO-50 Variable Pressure SEM
  • LaB6 emitter system
  • Digital image storage
  • Resolution of secondary electron image:
    • 2.0nm (at accelerating voltage 30kV)
  • Resolution of backscattered electron image at variable pressure:
    • 4.5nm (at accelerating voltage 30kV)
  • Extended Range Peltier Cooling Stage: Temperature Range: -30C to +50C
  • Attached Bruker Quantax 200 X Flash EDX Spectrometer System (LN2-free high speed 30mm2 SDD Detector)
  • Fullam Heating Stage to 1200C
  • Accelerating voltage: 0.2-30kV
  • Magnification range: 7X to 1,000,000X
  • Will be maintained on service contract
HITACHI TM-1000 Table-Top SEM
  • Easy to use
  • Depth of Focus: 0.5mm
  • Resolution: 30nm
  • Magnification Range: 20-10,000
  • Sample Size: Up to 70mm
  • Stereoscopic
  • Available for Outreach
A picture of the HITACHI TM-1000 Table-Top SEM

The HITACHI TM-1000 Table-Top SEM

Transmission Electron Microscopes

JEOL 1230 120kV TEM
  • Tungston emitter
  • Accelerating voltage - 80 kV
  • Resolution: Point: .36 nm Lattice: .2 nm
  • Bottom mount Gatan Camera with Digital Micrograph Software
  • Single tilt holder
  • Based on MS Windows™ software
  • High-stability goniometer stage
  • 5 spot sizes
A picture of the JEOL 1230 120kV TEM

The JEOL 1230 120kV TEM

JEOL 2100 200kV TEM
  • LaB6 emitter
  • Accelerating voltage - 80,100,120,160,200 kV
  • Resolution: Point: 0.23 nm, Lattice: 0.14 nm
  • Oxford EDS system for elemental analysis and mapping
  • Bottom and side mount Gatan Cameras with Digital Micrograph Software
  • Double and single tilt holders
  • Based on MS Windows™ software
  • High-stability goniometer stage and the highest probe current for any given probe size, which allows for improved analytical and diffraction capabilities. The patented JEOL Alpha Selector™ allows a user the selection of a variety of illumination conditions, ranging from full convergent beam to parallel illumination